PARTICLE INDUCED X RAY EMISSION SPECTROMETRY
\pˈɑːtɪkə͡l ɪndjˈuːst ˈɛks ɹˈe͡ɪ ɪmˈɪʃən spɛktɹˈɒmətɹi], \pˈɑːtɪkəl ɪndjˈuːst ˈɛks ɹˈeɪ ɪmˈɪʃən spɛktɹˈɒmətɹi], \p_ˈɑː_t_ɪ_k_əl ɪ_n_d_j_ˈuː_s_t ˈɛ_k_s ɹ_ˈeɪ ɪ_m_ˈɪ_ʃ_ə_n s_p_ɛ_k_t_ɹ_ˈɒ_m_ə_t_ɹ_i]\
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Identification and measurement of concentration of elements based on the fact that x-rays emitted by an excited element have a wavelength characteristic of that element and an intensity related to its concentration. It includes fluorescence, or secondary-emission, x-ray spectrometry, in which the specimen is irradiated by x-rays. Primary-emission x-ray spectrometry, in which the specimen is bombarded by electrons, is a specific type of x-ray emission spectrometry known as ELECTRON PROBE MICROANALYSIS.
By DataStellar Co., Ltd
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